This school will provide a thorough background on the principles of the atom probe technique, from the theory of the field evaporation to data mining. Lectures will focus on the basics of APT with a special emphasis on up-to-date techniques (laser-pulsing, DLD detectors, FIB specimen preparation). Beside this lecture series, practicals are organized including specimen preparation, Field Ion Microscopy, APT analysis and data mining.
The school will take place from 16 to 22 November 2020.
More information coming soon