The Atom under intense electric field and electromagnetic illumination
Leaders : Williams Lefebvre, François Vurpillot
Since its creation in the 1970’s, the laboratory continues to develop one of the world’s rarest cutting edge techniques capable of providing quantitative analysis at the atomic scale in 3 dimensions on various materials such as alloys semi-conductors, oxides and ceramics…: The Tomographic Atom Probe.
Research in this domain is subdivided into 3 themes:
- Instrumental development of the Tomographic Atom Probe
- Data processing and understanding of phenomenon limiting the performances of the technique (material under high electric field and ultrafast illumination)
- Breakthrough research for the development of new concepts and tools for material analysis at the atomic scale. New instruments born from these researches are transferred to CAMECA, the society which commercializes the atom probe around the world, through an exclusive partnership.