[Séminaire 25 juin 11h] Bringing Atom Probe Tomography to Transmission Electron Microscopes

Bonjour à tous,

En 2024, le GPM a réalisé une première mondiale en démontrant qu’il était possible d’implémenter une sonde atomique tomographique dans un microscope électronique en transmission commercial. Le 25 juin à 11h et en salle de conférence, Williams Lefebvre présentera un séminaire dans lequel il détaillera les différentes étapes de cette réalisation ainsi que les nouvelles possibilités qu’elle offre pour la caractérisation des matériaux. Le résumé de ce séminaire est disponible plus bas.

In 2024, the GPM achieved a world first by demonstrating that it was possible to implement an APT in a commercial transmission electron microscope. On June 25 at 11 a.m. in the conference room, Williams Lefebvre will present a seminar in which he will detail the various stages of this achievement and the new possibilities it offers for materials characterization. A summary of the seminar is available below.


Bringing Atom Probe Tomography to Transmission Electron Microscopes

Gerald Da Costa, Celia Castro, Antoine Normand, Charly Vaudolon, Aidar Zakirov, Juan Macchi, Mohammed Ilhami, François Vurpillot, Williams Lefebvre

 Since its invention just over 30 years ago, Atom Probe Tomography (APT) has emerged as a pivotal tool in the design of nanostructured materials, addressing the challenges posed by modern metallurgy, energy storage, and answering fundamental questions into geological scenarios of the past. As an inherently 3D characterization technique, APT provides simultaneously the position and elemental nature of individual atoms with near-atomic spatial resolution. For the purpose of enhancing the structural insights within the 3D composition fields revealed by APT, correlative microscopy approaches, combining (scanning) transmission electron microscopy (STEM and TEM) with APT, have emerged and demonstrated their relevance. To push the boundaries further and facilitate a more comprehensive analysis of nanoscale matter by coupling numerous two- or three-dimensional datasets, there is an increasing interest in combining STEM and APT into a unified instrument. This study presents the tangible outcome of an instrumental endeavour aimed at integrating APT into a commercial TEM. The resulting instrument demonstrates the feasibility of combining in situ 3D reconstructions of composition fields with the detailed structural analysis afforded by STEM. This milestone heralds promising prospects for the convergence of these two major nanoscale microscopy techniques in the foreseeable future.

We look forward to seeing you there!