In the framework of a new project (Fusion SATMET), GPM has recently acquired a new STEM equipped with a time resolved direct detection camera, electron precession and advanced softwares allowing for orientation mapping. Preliminary work has allowed the design and fabrication of original TEM holders that allow to reproduce the condition of APT in STEM, i.e. application of a high voltage (DC + pulsing) to a sharp needle at cryogenic temperature. Beyond the coupling with APT detection in STEM, a main axis of the project is to take advantage of 4D STEM methodologies to extract a maximum of information such as: i) the electric field mapping in and around the polarised specimens; ii) evolution of electric field distribution during the sequence of field evaporation of specimens; iii) the mapping of crystal defects (e.g. grain boundaries, dislocations).
We are now seeking a post-doctoral fellow that will rapidly be able to produce original results that shall be published from the first year of the fellowship. Candidates must hold a PhD in materials sciences. A strong background in transmission electron microscopy is highly recommended. Skills in coding will be appreciated (e.g. python, MatLab, c++). Previous experience with atom probe tomography and/or specimen preparation in FIB SEM is not mandatory but might be considered interesting.
The duration of the post-doctoral fellowship is 1 year (+1 renewable year possible), starting autumn 2022 or earlier. This post-doctoral fellowship is granted by the European Union (ERDF) and Normandy Regional Council in the framework of RIN Tremplin Fusion SATMET.
Interested candidates should send a CV, a letter of motivation and the names of 2-3 references to williams.lefebvre@univ-rouen.fr